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APPLICATION OF MULTIOBJECTIVE "CAMERA OBSCURA" SYSTEM FOR MEASURING ELECTRON TEMPERATURE OF PLASMA GENERATED IN THE PLASMA FOCUS DEVICE

Author
DENUS S; KOWALSKI S; SKRZECZANOWSKI W; SLEDZINSKI S; WAWER J
S. KALISKI INST. PLASMA PHYS. LASER MICROFUSION/WARSZAWA/POL
Source
J. TECH. PHYS.; ISSN 0324-8313; POL; DA. 1980; VOL. 21; NO 3; PP. 375-385; ABS. POL/RUS; BIBL. 11 REF.
Document type
Article
Language
English
Keyword (fr)
PLASMA FOCALISE TEMPERATURE ELECTRONIQUE DIAGNOSTIC PLASMA PHOTOGRAPHIE RX FILTRE PHYSIQUE DES PLASMAS
Keyword (en)
FOCUSED PLASMA ELECTRON TEMPERATURE PLASMA DIAGNOSTIC X RAY PHOTOGRAPHY FILTER PLASMA PHYSICS
Keyword (es)
FISICA DE LAS PLASMAS
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B30 Atomic and molecular physics

Discipline
Atomic and molecular physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL8130173274

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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