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COMPARISON OF SPREADING RESISTANCE CORRECTION FACTOR ALGORITHMS USING MODEL DATA

Author
ALBERS J
NATIONAL BUREAU STANDARDS/WASHINGTON DC 20234/USA
Source
SOLID-STATE ELECTRON.; ISSN 0038-1101; GBR; DA. 1980; VOL. 23; NO 12; PP. 1197-1205; BIBL. 16 REF.
Document type
Article
Language
English
Keyword (fr)
RESISTANCE ETALEMENT ALGORITHME SEMICONDUCTEUR FACTEUR CORRECTION SIMULATION DISPOSITIF SEMICONDUCTEUR DISPOSITIF ETAT SOLIDE ELECTRONIQUE
Keyword (en)
SPREADING RESISTANCE ALGORITHMS SEMICONDUCTOR MATERIALS CORRECTION FACTOR SIMULATION SEMICONDUCTOR DEVICE SOLID STATE DEVICE ELECTRONICS
Keyword (es)
ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL8130226700

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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