DETERMINATION OF THICKNESS, REFRACTIVE INDEX AND DISPERSION OF WAVEGUIDING THIN FILMS WITH AN ABBE REFRACTOMETER
- Author
- HERRMANN PP
SWISS FEDERAL INST. TECHNOL./ZURICH 8093/CHE - Source
- APPL. OPT.; ISSN 0003-6935; USA; DA. 1980; VOL. 19; NO 19; PP. 3261-3262; BIBL. 8 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- OPTIQUE INTEGREE GUIDE ONDE OPTIQUE COUCHE MINCE EPAISSEUR INDICE REFRACTION REFRACTOMETRIE REFRACTOMETRE DISPERSION OPTIQUE MESURE COUPLEUR OPTIQUE PRISME OPTIQUE ELECTRONIQUE
- Keyword (en)
- INTEGRATED OPTICS OPTICAL WAVEGUIDE THIN FILM THICKNESS REFRACTIVE INDEX REFRACTOMETRY REFRACTOMETER OPTICAL DISPERSION MEASUREMENT OPTICAL COUPLER PRISM OPTICS ELECTRONICS
- Keyword (es)
- OPTICA ELECTRONICA
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics
- Discipline
- Electronics Theoretical physics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL8130251441
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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