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A NOVEL APPROACH TO THE DESIGN OF MULTIPLE-PROBE HIGH-POWER MICROWAVE AUTOMATIC IMPEDANCE MEASURING SCHEMES

Author
HU CLJ
UNIV. COLORADO, DEP. ELECTR. ENG./BOULDER CO 80309/USA
Source
IEEE TRANS. MICROWAVE THEORY TECH.; ISSN 0018-9480; USA; DA. 1980; VOL. 28; NO 12; PP. 1422-1428; BIBL. 6 REF.
Document type
Article
Language
English
Keyword (fr)
HYPERFREQUENCE IMPEDANCE ELECTRIQUE MESURE AUTOMATIQUE PUISSANCE ELEVEE MESURE ELECTROMAGNETISME ELECTRONIQUE
Keyword (en)
MICROWAVE ELECTRICAL IMPEDANCE AUTOMATIC MEASUREMENT MEASUREMENT ELECTROMAGNETISM ELECTRONICS
Keyword (es)
ELECTROMAGNETISMO ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL8130251523

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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