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A NEW LOAD PULL MEASUREMENT TECHNIQUE EASES GAAS CHARACTERIZATION

Author
ZEMACK D
MICROWAVE SEMICONDUCTOR CORP./SOMERSET NJ/USA
Source
MICROWAVE J.; ISSN 0026-2897; USA; DA. 1980; VOL. 23; NO 11; PP. 63-67; 4 P.; BIBL. 9 REF.
Document type
Article
Language
English
Keyword (fr)
METHODE GRAPHIQUE CHARGE CIRCUIT IMPEDANCE CHARGE TRANSISTOR EFFET CHAMP TRANSISTOR HYPERFREQUENCE CONCEPTION GALLIUM ARSENIURE ELECTRONIQUE
Keyword (en)
GRAPHIC METHOD CIRCUIT LOAD LOAD IMPEDANCE FIELD EFFECT TRANSISTOR MICROWAVE TRANSISTOR DESIGN ELECTRONICS
Keyword (es)
ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL8130262414

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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