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COMPLEX PERMITTIVITY MEASUREMENT OF MIC SUBSTRATE

Author
GUILLON P; GARAULT Y
U.E.R. SCI., LAB. ELECTRON. MICROONDES/LIMOGES 87060/FRA
Source
AEUE, ARCH. ELEKTRON. UEBERTRANGUNSTECH.; ISSN 0001-1096; DEU; DA. 1981; VOL. 35; NO 3; PP. 102-104; ABS. GER; BIBL. 6 REF.
Document type
Article
Language
English
Keyword (fr)
HYPERFREQUENCE CONSTANTE DIELECTRIQUE CONSTANTE DIELECTRIQUE COMPLEXE CIRCUIT HYPERFREQUENCE CIRCUIT INTEGRE MESURE PERTE DIELECTRIQUE RESONATEUR HYPERFREQUENCE SUPPORT ELECTROMAGNETISME ELECTRONIQUE
Keyword (en)
MICROWAVE DIELECTRIC CONSTANT COMPLEX PERMITTIVITY MICROWAVE CIRCUIT INTEGRATED CIRCUIT MEASUREMENT DIELECTRIC LOSS MICROWAVE RESONATOR ELECTROMAGNETISM ELECTRONICS
Keyword (es)
ELECTROMAGNETISMO ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL8130269145

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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