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CONTAMINATION CONTROL IN LEAD BONDING TO THICK AND THIN FILMS

Author
WAGNER JA; JELLISON JL
SANDIA NATIONAL LABORATORIES/ALBUQUERQUE NM 87185/USA
Source
I.E.E.E. TRANS. COMPON. HYBR. MANUFG TECHNOL.; USA; DA. 1980; VOL. 3; NO 2; PP. 281-287; BIBL. 6 REF.
Document type
Article
Language
English
Keyword (fr)
COUCHE MINCE COUCHE EPAISSE CONTAMINATION CIRE RESIDU FABRICATION MICROELECTRONIQUE CONNEXION DEPASSANTE INTERCONNEXION NETTOYAGE RAYONNEMENT UV DECHARGE ELECTRIQUE ELECTRONIQUE
Keyword (en)
THIN FILM THICK FILM CONTAMINATION WAX RESIDUE MICROELECTRONIC FABRICATION BEAM LEAD INTERCONNECTION CLEANING ULTRAVIOLET RADIATION ELECTRIC DISCHARGE ELECTRONICS
Keyword (es)
ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL8130302310

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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