A MODEL OF INTERFACE STATES AND CHARGES AT THE SI-SIO2 INTERFACE: ITS PREDICTIONS AND COMPARISONS WITH EXPERIMENTS
- Author
- NGAI KL; WHITE CT
NAVAL RES. LAB./WASHINGTON DC 20375/USA - Source
- J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1981; VOL. 52; NO 1; PP. 320-337; BIBL. 64 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- CONTACT ELECTRIQUE CONTACT OXYDE SEMICONDUCTEUR ETAT ELECTRONIQUE INTERFACE CHARGE ELECTRIQUE SIMULATION ELECTRONIQUE PHYSIQUE SOLIDE
- Keyword (en)
- ELECTRIC CONTACT SEMICONDUCTOR OXIDE CONTACT INTERFACE ELECTRON STATE ELECTRICAL CHARGE SIMULATION ELECTRONICS SOLID PHYSICS
- Keyword (es)
- ELECTRONICA FISICA DEL ESTADO CONDENSADO
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties
- Discipline
- Electronics Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL8130344188
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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