CARACTERISATION AUTOMATIQUE EN HYPERFREQUENCES DU TRANSISTOR A EFFET DE CHAMP
- Author
- PARISOT M; BINET M; RABIER A
LAB. ELECTRON. PHYS. APPL./LIMEIL-BREVANNES 94450/FRA - Source
- ACTA ELECTRON; ISSN 0001-558X; FRA; DA. 1980; VOL. 23; NO 2; PP. 137-149; ABS. GER/ENG; BIBL. 14 REF.
- Document type
- Article
- Language
- French
- Keyword (fr)
- TRANSISTOR EFFET CHAMP TRANSISTOR HYPERFREQUENCE PARAMETRE S MESURE CORRECTION ANALYSEUR RESEAU AUTOMATISATION GALLIUM ARSENIURE ELECTRONIQUE
- Keyword (en)
- FIELD EFFECT TRANSISTOR MICROWAVE TRANSISTOR S PARAMETER MEASUREMENT CORRECTIONS NETWORK ANALYZER AUTOMATION ELECTRONICS
- Keyword (es)
- ELECTRONICA
- Classification
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL8130405121
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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Istex access
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