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OHMIC CONTACTS TO N-GAAS USING LOW-TEMPERATURE ANNEAL

Author
WERTHEN JG; SCIFRES DR
STANFORD UNIV., DEP. MATERIALS SCI./STANFORD CA/USA
Source
J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1981; VOL. 52; NO 2; PP. 1127-1129; BIBL. 12 REF.
Document type
Article
Language
English
Keyword (fr)
CONTACT ELECTRIQUE CONTACT OHMIQUE CONDUCTIVITE TYPE N RECUIT TRES BASSE TEMPERATURE FABRICATION COMPOSITION CHIMIQUE CONDUCTIVITE ELECTRIQUE GALLIUM ARSENIURE ELECTRONIQUE PHYSIQUE SOLIDE
Keyword (en)
ELECTRIC CONTACT OHMIC CONTACT N TYPE CONDUCTIVITY ANNEALING VERY LOW TEMPERATURE CHEMICAL COMPOSITION ELECTRICAL CONDUCTIVITY ELECTRONICS SOLID PHYSICS
Keyword (es)
ELECTRONICA FISICA DEL ESTADO CONDENSADO
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL8130405141

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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