DETERMINING THE REFRACTIVE INDEX AND THICKNESS OF THIN FILMS FROM PRISM COUPLER MEASUREMENTS
- Author
- KIRSCH ST
M.I.T., DEP. ELECTR. ENG. COMPUTER SCI./CAMBRIDGE MA 02139/USA - Source
- APPL. OPT.; ISSN 0003-6935; USA; DA. 1981; VOL. 20; NO 12; PP. 2085-2089; BIBL. 11 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- COUCHE MINCE INDICE REFRACTION EPAISSEUR MESURE COUPLEUR OPTIQUE PRISME REFRACTOMETRIE METROLOGIE PHYSIQUE THEORIQUE
- Keyword (en)
- THIN FILM REFRACTIVE INDEX THICKNESS MEASUREMENT OPTICAL COUPLER PRISM REFRACTOMETRY MEASUREMENT SCIENCE THEORETICAL PHYSICS
- Keyword (es)
- METROLOGIA FISICA TEORICA
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics
- Discipline
- Theoretical physics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL8130441164
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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