A NEW DEGRADATION PHENOMENON IN BLUE LIGHT EMITTING SILICON CARBIDE DIODES
- Author
- ZIEGLER G; THEIS D
SIEMENS RES. LAB./ERLANGEN MUENCHEN/DEU - Source
- IEEE TRANS. ELECTRON DEVICES; ISSN 0018-9383; USA; DA. 1981; VOL. 28; NO 4; PP. 425-427; BIBL. 8 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- DIODE DIODE LUMINESCENTE LUMIERE BLEUE DETERIORATION STRIATION DEFAUT EMPILEMENT BANDE INTERDITE SILICIUM CARBURE ELECTRONIQUE
- Keyword (en)
- DIODE BLUE LIGHT DETERIORATION STRIATIONS STACKING FAULT ENERGY GAP SILICON CARBIDE ELECTRONICS
- Keyword (es)
- ELECTRONICA
- Classification
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL8130463719
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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