ELECTRICAL AND STRUCTURAL PROPERTIES OF FLASH-EVAPORATED FERROELECTRIC LEAD GERMANATE FILMS ON SILICON
- Author
- ABHAI MANSINGH; KRUPANIDNI SB
UNIV. DELHI, DEP. PHYS. ASTROPHYS./DELHI 110007/IND - Source
- THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1981; VOL. 80; NO 4; PP. 359-371; BIBL. 33 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- COMPOSE MINERAL ELEMENT GROUPE IVB COMPOSE FERROELECTRIQUE DEPOT SOUS VIDE EVAPORATION FLASH RECUIT COMPOSITION CHIMIQUE ANALYSE ME BALAYAGE ANALYSE DIFFRACTION ELECTRON ANALYSE DIFFRACTION RX ORIENTATION PREFERENTIELLE FERROELECTRICITE CONSTANTE DIELECTRIQUE CONDUCTIVITE ELECTRIQUE COUCHE MINCE CROISSANCE CRISTALLINE MICROSTRUCTURE PLOMB GERMANATE SPECTROMETRIE IR HETEROJONCTION CARACTERISTIQUE CAPACITE TENSION CARACTERISTIQUE COURANT TENSION SUPPORT SI CRISTALLOGRAPHIE PHYSIQUE SOLIDE
- Keyword (en)
- INORGANIC COMPOUND FERROELECTRIC MATERIALS VACUUM DEPOSITION FLASH EVAPORATION ANNEALING CHEMICAL COMPOSITION PREFERRED ORIENTATION FERROELECTRICITY DIELECTRIC CONSTANT ELECTRICAL CONDUCTIVITY THIN FILM CRYSTAL GROWTH MICROSTRUCTURE ULTRASTRUCTURE INFRARED SPECTROMETRY INFRARED SPECTROSCOPY HETEROJUNCTION VOLTAGE CAPACITY CURVE VOLTAGE CURRENT CURVE CRISTALLOGRAPHY SOLID PHYSICS
- Keyword (es)
- CRISTALOGRAFIA FISICA DEL ESTADO CONDENSADO
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL8130523886
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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