Pascal and Francis Bibliographic Databases

Help

Export

Selection :

Permanent link
http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=PASCAL82X0012107

DETERMINATION OF TRAP PARAMETERS IN ELECTRODEPOSITED CDTE BY SCHOTTKY BARRIER CAPACITANCE MEASUREMENTS

Author
BASOL BM; STAFSUDD OM
UNIV. CALIFORNIA, ELECTR. SCI. ENG. DEP./LOS ANGELES CA 90024/USA
Source
THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1981; VOL. 78; NO 3; PP. 217-222; BIBL. 15 REF.
Document type
Article
Language
English
Keyword (fr)
COUCHE MINCE METAL TRANSITION COMPOSE BARRIERE SCHOTTKY CAPACITE CARACTERISTIQUE CAPACITE TENSION TEMPERATURE FREQUENCE PIEGEAGE PORTEUR CHARGE ELECTRON POLYCRISTAL DEPOT ELECTROLYTIQUE CADMIUM TELLURURE PHYSIQUE SOLIDE
Keyword (en)
THIN FILM TRANSITION METAL COMPOUNDS SCHOTTKY BARRIER CAPACITY TEMPERATURE FREQUENCY ELECTRONS POLYCRYSTAL ELECTROPLATING CADMIUM TELLURIDES SOLID PHYSICS
Keyword (es)
FISICA DEL ESTADO CONDENSADO
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL82X0012107

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

Searching the Web