X-RAY MULTIPLE DIFFRACTION AS A TOOL FOR STUDYING HETEROEPITAXIAL LAYERS. I: COHERENT, ON-AXIS LAYERS
- Autor
- ISHERWOOD BJ; BROWN BR; HALLIWELL MAG
GEC HIRST RES. CENT./WEMBLEY MIDDX/GBR - Fuente
- J. CRYST. GROWTH; ISSN 0022-0248; NLD; DA. 1981; VOL. 54; NO 3; PP. 449-460; BIBL. 22 REF.
- Tipo de documento
- Article
- Idioma
- English
- Palabra clave (fr)
- COMPOSE MINERAL ETUDE EXPERIMENTALE SOLUTION SOLIDE COMPOSITION CHIMIQUE HETEROEPITAXIE DIFFRACTION RX DIFFRACTION MULTIPLE METHODE PHASE LIQUIDE METHODE PHASE VAPEUR CROISSANCE CRISTALLINE COUCHE EPITAXIQUE ALUMINIUM GALLIUM ARSENIURE MIXTE METHODE KOSSEL SUPPORT GAAS CRISTALLOGRAPHIE
- Palabra clave (in)
- INORGANIC COMPOUND EXPERIMENTAL STUDY SOLID SOLUTION CHEMICAL COMPOSITION HETEROEPITAXY X RAY DIFFRACTION MULTIPLE DIFFRACTION GROWTH FROM LIQUID GROWTH FROM VAPOR CRYSTAL GROWTH EPITAXIAL FILM ALUMINIUM GALLIUM ARSENIDES MIXED CRISTALLOGRAPHY
- Palabra clave (es)
- CRISTALOGRAFIA
- Clasificación
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography
- Disciplina
- Physics of condensed state : structure, mechanical and thermal properties
- Procedencia
- Inist-CNRS
- Base de datos
- PASCAL
- Identificador INIST
- PASCAL82X0026297
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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