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ROUGHNESS DEPENDENCE OF ONE-DIMENSIONALLY ELONGATED DICHROMATIC SPECKLE PATTERNS

Author
NAKAGAWA K; ASAKURA T
HOKKAIDO UNIV., RES. INST. APPLIED ELECTR./HOKKAIDO 060/JPN
Source
OPTIK (STUTTG.); ISSN 0030-4026; DEU; DA. 1981; VOL. 59; NO 5; PP. 389-400; ABS. GER; BIBL. 8 REF.
Document type
Article
Language
English
Keyword (fr)
SPECKLE RUGOSITE SURFACE RUGUEUSE MESURE PHOTOGRAPHIE SPECKLE APPLICATION CONTRASTE TRANSFORMATION FOURIER FRANGE INTERFERENCE METROLOGIE PHYSIQUE THEORIQUE
Keyword (en)
ROUGHNESS ROUGH SURFACE MEASUREMENT SPECKLE PHOTOGRAPHY APPLICATION CONTRAST FOURIER TRANSFORMATION INTERFERENCE FRINGE MEASUREMENT SCIENCE THEORETICAL PHYSICS
Keyword (es)
METROLOGIA FISICA TEORICA
Classification
Pascal
001 Exact sciences and technology / 001B Physics

Discipline
Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL82X0058351

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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