Pascal and Francis Bibliographic Databases

Help

Export

Selection :

Permanent link
http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=PASCAL82X0059320

ROTATING RING-DISC ELECTRODES STUDIES OF THE GRAIN-BOUNDARY AND SURFACE DAMAGE EFFECTS ON THE STABILIZATION OF N-SI PHOTOANODE

Author
LOO BH; FRESE KW JR; MORRISON SR
SRI INTERNATIONAL/MENLO PARK CA 94025/USA
Source
APPL. SURF. SCI.; ISSN 0378-5963; NLD; DA. 1981; VOL. 8; NO 3; PP. 290-298; BIBL. 18 REF.
Document type
Article
Language
English
Keyword (fr)
PHOTOELECTROCHIMIE SEMICONDUCTEUR DISPOSITIF PHOTOELECTROCHIMIQUE ANODE ELECTRODE CONDUCTIVITE TYPE N STABILISATION PROPRIETE SURFACE ELECTRODE DISQUE ANNEAU ELECTRODE TOURNANTE SILICIUM ELECTROCHIMIE CHIMIE GENERALE CHIMIE PHYSIQUE
Keyword (en)
SEMICONDUCTOR MATERIALS ANODE ELECTRODES STABILIZATION SURFACE PROPERTIES RING DISK ELECTRODE SILICON ELECTROCHEMISTRY GENERAL CHEMISTRY PHYSICAL CHEMISTRY
Keyword (es)
ELECTROQUIMICA QUIMICA GENERAL QUIMICA FISICA
Classification
Pascal
001 Exact sciences and technology / 001C Chemistry / 001C01 General and physical chemistry

Discipline
General chemistry and physical chemistry
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL82X0059320

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

Searching the Web