ELECTRICAL BREAKDOWN AT CRYOGENIC TEMPERATURES-BREAKDOWN IN LIQ. HE AND INFLUENCE OF SECONDARY FACTORS
- Author
- YOSHINO K; FUJII H; KAIZAKI I; SHIRAISHI M; INUISHI Y
- Source
- TECHNOL. REP. OSAKA UNIV.; ISSN 0030-6177; JPN; DA. 1980; VOL. 30; NO 1551-1582; PP. 475-481; BIBL. 9 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- DECHARGE ELECTRIQUE LIQUIDE AMORCAGE HELIUM TEMPERATURE CRYOGENIQUE ELECTRODE MATERIAU ETAT SURFACE ETUDE EXPERIMENTALE RIGIDITE DIELECTRIQUE DIELECTRIQUE DIELECTRIQUE LIQUIDE GAZ LIQUIDE PHYSIQUE DES PLASMAS ELECTROMAGNETISME ELECTROTECHNIQUE
- Keyword (en)
- ELECTRIC DISCHARGE LIQUID HELIUM CRYOGENIC TEMPERATURE ELECTRODES MATERIALS SURFACE TEXTURE EXPERIMENTAL STUDY DIELECTRIC MATERIALS GAS LIQUID PLASMA PHYSICS ELECTROMAGNETISM ELECTRICAL ENGINEERING
- Keyword (es)
- FISICA DE LAS PLASMAS ELECTROMAGNETISMO ELECTROTECNICA
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D05 Electrical engineering. Electrical power engineering
- Discipline
- Atomic and molecular physics Electrical engineering. Electroenergetics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL82X0073317
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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