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A DESIGN OF PROGRAMMABLE LOGIC ARRAYS WITH UNIVERSAL TESTS

Author
FUJIWARA H; KINOSHITA K
OSAKA UNIV., DEP. ELECTRON./OSAKA/JPN
Source
IEEE TRANS. COMPUT.; ISSN 0018-9340; USA; DA. 1981; VOL. 30; NO 11; PP. 823-828; BIBL. 12 REF.
Document type
Article
Language
English
Keyword (fr)
DETECTION DEFAUT CIRCUIT LOGIQUE CONCEPTION CIRCUIT FIABILITE TABLEAU LOGIQUE PROGRAMMABLE TEST CIRCUIT INFORMATIQUE MATHEMATIQUES APPLIQUEES
Keyword (en)
DEFECT DETECTION RELIABILITY COMPUTER SCIENCES APPLIED MATHEMATICS
Keyword (es)
INFORMATICA MATEMATICAS APPLICADAS
Classification
Pascal
001 Exact sciences and technology / 001A Sciences and techniques of general use / 001A02 Mathematics

Discipline
Mathematics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL82X0084448

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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