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LOGIC AND FAULT SIMULATIONS

Author
ELDUMIATI II; GADENZ RN
BELL LABORATORIES/HOLMDEL NJ 07733/USA
Source
BELL SYST. TECH. J.; ISSN 0005-8580; USA; DA. 1981; VOL. 60; NO 7; PART. 2; PP. 1463-1473; BIBL. 13 REF.
Document type
Article
Language
English
Keyword (fr)
SIMULATION CIRCUIT LOGIQUE PANNE CIRCUIT INTEGRE TRAITEMENT NUMERIQUE ELECTRONIQUE
Keyword (en)
SIMULATION BREAKDOWN INTEGRATED CIRCUIT ELECTRONICS
Keyword (es)
ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL82X0099528

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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