Pascal and Francis Bibliographic Databases

Help

Permanent link : http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=PASCAL82X0124904

Export

Selection :

A DESIGN OF PROGRAMMABLE LOGIC ARRAYS WITH UNIVERSAL TESTS

Author
FUJIWARA H; KINOSHITA K
OSAKA UNIV., DEP. ELECTRON. ENG./OSAKA/JPN
Source
IEEE TRANS. CIRCUITS SYST.; ISSN 0098-4094; USA; DA. 1981; VOL. 28; NO 11; PP. 1027-1032; BIBL. 12 REF.
Document type
Article
Language
English
Keyword (fr)
CIRCUIT LOGIQUE CIRCUIT LOGIQUE PROGRAMMABLE ESSAI FIABILITE DETECTION PANNE CIRCUIT INTEGRE CIRCUIT LSI LOCALISATION PANNE ESSAI UNIVERSEL ELECTRONIQUE
Keyword (en)
TEST RELIABILITY INTEGRATED CIRCUIT ELECTRONICS
Keyword (es)
ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL82X0124904

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

Searching the Web