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DETERMINATION OF THE THRESHOLD-ENERGY SURFACE FOR COPPER USING IN-SITU ELECTRICAL-RESISTIVITY MEASUREMENTS IN THE HIGH-VOLTAGE ELECTRON MICROSCOPE

Other title
DETERMINATION DE LA SURFACE D'ENERGIE DE SEUIL POUR LE CUIVRE EN UTILISANT DES MESURES DE RESISTIVITE ELECTRIQUE IN-SITU DANS LE MICROSCOPE ELECTRONIQUE A HAUTE TENSION (fr)
Author
KING WE; MERKLE KL; MESHII M
NORTHWESTERN UNIV., DEP. MATERIALS SCI. ENG./EVANSTON IL 60201/USA
Source
PHYS. REV. B; ISSN 0163-1829; USA; DA. 1981; VOL. 23; NO 12; PP. 6319-6334; BIBL. 41 REF.
Document type
Article
Language
English
Keyword (fr)
METAL METAL TRANSITION MICROSCOPIE ELECTRONIQUE HAUTE TENSION PAIRE FRENKEL FORMATION CINETIQUE SEUIL ENERGIE DENSITE DEFAUT CRISTALLIN DEFAUT PONCTUEL RESISTIVITE ELECTRIQUE ETUDE EXPERIMENTALE DEFAUT IRRADIATION IRRADIATION ELECTRON CUIVRE ELECTRON CONDUCTIVITE ELECTRIQUE MONOCRISTAL METAL PUR CU SURFACE ENERGIE CRISTALLOGRAPHIE METALLURGIE
Keyword (en)
METAL TRANSITION METAL HIGH VOLTAGE ELECTRON MICROSCOPY FRENKEL DEFECT FORMATION KINETICS THRESHOLD ENERGY CRYSTAL DEFECT DENSITY POINT DEFECT ELECTRIC RESISTIVITY EXPERIMENTAL STUDY IRRADIATION DEFECT COPPER IRRADIATION ELECTRONS ELECTRICAL CONDUCTIVITY SINGLE CRYSTAL CRISTALLOGRAPHY METALLURGY
Keyword (es)
CRISTALOGRAFIA METALURGIA
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D11 Metals. Metallurgy

Discipline
Metals. Metallurgy Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL82X0126640

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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