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CONSTANT-PSI CONSTANT-DELTA CONTOUR MAPS: APPLICATIONS TO ELLIPSOMETRY AND TO REFLECTION TYPE OPTICAL DEVICES

Author
ZAGHLOUL ARM; AZZAM RMA
CAIRO UNIV., ELECTR. ENG. DEP./CAIRO/EGY
Source
APPL. OPT.; ISSN 0003-6935; USA; DA. 1982; VOL. 21; NO 4; PP. 739-743; BIBL. 6 REF.
Document type
Article
Language
English
Keyword (fr)
COUCHE MINCE ELLIPSOMETRIE SUBSTRAT SILICIUM SILICIUM OXYDE LASER REFLEXION OPTIQUE SYSTEME OPTIQUE POLARISEUR DIAGRAMME CARTE EPAISSEUR ANGLE INCIDENCE CONTOUR DELTA CONSTANT CONTOUR PSI CONSTANT RETARDATEUR METROLOGIE PHYSIQUE THEORIQUE
Keyword (en)
THIN FILM ELLIPSOMETRY SILICON SILICON OXIDES LASER OPTICAL REFLECTION DIAGRAM MAPS THICKNESS ANGLE OF INCIDENCE MEASUREMENT SCIENCE THEORETICAL PHYSICS
Keyword (es)
METROLOGIA FISICA TEORICA
Classification
Pascal
001 Exact sciences and technology / 001B Physics

Discipline
Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL82X0200397

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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