ELECTRICAL CONDUCTIVITY, DEFECT DENSITY AND STRUCTURE OF OBLIQUELY VACUUM-DEPOSITED TIN ANTIMONIDE ALLOY THIN FILMS
- Author
- DAMODARA DAS V; JAGADEESH MS
INDIAN INST. TECHNOL./MADRAS 600 036/IND - Source
- J. MATER. SCI.; ISSN 0022-2461; GBR; DA. 1982; VOL. 17; NO 3; PP. 671-676; BIBL. 17 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- COMPOSE MINERAL DEPOT SOUS VIDE DENSITE DEFAUT CRISTALLIN ANGLE INCIDENCE CONDUCTIVITE ELECTRIQUE ETUDE EXPERIMENTALE TRAITEMENT THERMIQUE DISTORSION RESEAU COUCHE MINCE CROISSANCE CRISTALLINE MICROSTRUCTURE ETAIN ANTIMONIURE SUPPORT VERRE CRISTALLOGRAPHIE
- Keyword (en)
- INORGANIC COMPOUND VACUUM DEPOSITION CRYSTAL DEFECT DENSITY ANGLE OF INCIDENCE ELECTRICAL CONDUCTIVITY EXPERIMENTAL STUDY HEAT TREATMENT LATTICE DISTORSION THIN FILM CRYSTAL GROWTH MICROSTRUCTURE TIN ANTIMONIDES CRISTALLOGRAPHY
- Keyword (es)
- CRISTALOGRAFIA
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL82X0218563
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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