BETA MEASUREMENT AND BETA REQUIREMENT IN I2L GATES
- Author
- WISTED JM; WARNER RM JR; MURRAY EM; JINDAL RP
CONTROL DATA CORP./BLOOMINGTON MN 55420/USA - Source
- IEEE J. SOLID-STATE CIRCUITS; ISSN 0018-9200; USA; DA. 1982; VOL. 17; NO 1; PP. 93-95; BIBL. 6 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- CIRCUIT LOGIQUE LOGIQUE INTEGREE INJECTION TRANSISTOR LATERAL COEFFICIENT TRANSPORT BASE ELECTRONIQUE
- Keyword (en)
- TRANSISTOR ELECTRONICS
- Keyword (es)
- ELECTRONICA
- Classification
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL82X0222329
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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