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AN ANALYTICAL MODEL OF SEM AND STEM CHARGE COLLECTION IMAGES OF DISLOCATIONS IN THIN SEMICONDUCTOR LAYERS. I. MINORITY CARRIER GENERATION, DIFFUSION, AND COLLECTION

Author
DONOLATO C
C.N.R., IST. LAMEL/BOLOGNA 40126/ITA
Source
PHYS. STATUS SOLIDI (A), APPL. RES.; ISSN 0031-8965; DDR; DA. 1981; VOL. 65; NO 2; PP. 649-658; ABS. GER; BIBL. 33 REF.
Document type
Article
Language
English
Keyword (fr)
ETUDE THEORIQUE MICROSCOPIE ELECTRONIQUE BALAYAGE MICROSCOPIE ELECTRONIQUE BALAYAGE TRANSMISSION MODELE 3 DIMENSIONS JONCTION P N DISLOCATION COUCHE MINCE SEMICONDUCTEUR MODE EBIC CRISTALLOGRAPHIE
Keyword (en)
THEORETICAL STUDY SCANNING ELECTRON MICROSCOPY SCANNING TRANSMISSION ELECTRON MICROSCOPY THREE DIMENSIONAL MODEL PN JUNCTION DISLOCATION THIN FILM SEMICONDUCTOR MATERIALS CRISTALLOGRAPHY
Keyword (es)
CRISTALOGRAFIA
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL82X0234425

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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