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A RIGOROUS TECHNIQUE FOR MEASURING THE SCATTERING MATRIX OF A MULTIPORT DEVICE WITH A 2-PORT NETWORK ANALYZER

Author
TIPPET JC
TRW DEFENSE SPACE SYSTEMS GROUP/REDONDO BEACH CA 90278/USA
Source
IEEE TRANS. MICROWAVE THEORY TECH.; ISSN 0018-9480; USA; DA. 1982; VOL. 30; NO 5; PP. 661-666; BIBL. 11 REF.
Document type
Article
Language
English
Keyword (fr)
CIRCUIT HYPERFREQUENCE CIRCUIT MULTIPOLE MATRICE DIFFUSION MESURE ANALYSEUR CIRCUIT ELECTRONIQUE
Keyword (en)
MICROWAVE CIRCUIT MULTIPOLE CIRCUIT DIFFUSION MATRIX MEASUREMENT NETWORK ANALYZER ELECTRONICS
Keyword (es)
ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL82X0301200

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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