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A MODEL FOR INTERPRETATION OF X-RAY ROCKING CURVE HALF-WIDTHS IN SOS

Author
CAREY KW
HEWLETT-PACKARD/PALO ALTO CA 94304/USA
Source
J. CRYST. GROWTH; ISSN 0022-0248; NLD; DA. 1982; VOL. 58; NO 1; PP. 1-9; BIBL. 14 REF.
Document type
Article
Language
English
Keyword (fr)
NON METAL INTENSITE PROFIL RAIE SPECTRALE ETUDE EXPERIMENTALE DIFFRACTION RX COUCHE EPITAXIQUE DEFAUT CRISTALLIN SILICIUM DIAGRAMME ROTATION SUPPORT SAPHIR CRISTALLOGRAPHIE
Keyword (en)
NON METAL INTENSITY SPECTRAL LINE PROFILE EXPERIMENTAL STUDY X RAY DIFFRACTION EPITAXIAL FILM CRYSTAL DEFECT SILICON CRISTALLOGRAPHY
Keyword (es)
CRISTALOGRAFIA
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL82X0303235

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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