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A SYSTEM FOR THE CORRECTION OF AXIAL APERTURE ABERRATIONS IN ELECTRON LENSES

Author
CREWE AV
UNIV. CHICAGO, DEP. PHYS. BIOPHYS./CHICAGO IL 60637/USA
Source
OPTIK (STUTTG.); ISSN 0030-4026; DEU; DA. 1982; VOL. 60; NO 3; PP. 271-281; ABS. GER; BIBL. 11 REF.
Document type
Article
Language
English
Keyword (fr)
OPTIQUE ELECTRONIQUE MICROSCOPE ELECTRONIQUE ABERRATION OPTIQUE ABERRATION SPHERIQUE CORRECTION LENTILLE MULTIPOLAIRE ELECTRONIQUE
Keyword (en)
ELECTRON OPTICS ELECTRON MICROSCOPE OPTICAL ABERRATION SPHERICAL ABERRATION CORRECTIONS ELECTRONICS
Keyword (es)
ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL82X0311411

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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