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ROUGHENING AND LOWER CRITICAL DIMENSION IN THE RANDOM-FIELD ISING MODEL

Author
GRINSTEIN G; SHANG KENG MA
IBM THOMAS J. WATSON RES. CENT./YORKTOWN HEIGHTS NY 10598/USA
Source
PHYS. REV. LETT.; ISSN 0031-9007; USA; DA. 1982; VOL. 49; NO 9; PP. 685-688; BIBL. 16 REF.
Document type
Article
Language
English
Keyword (fr)
MODELE ISING CHAMP ALEATOIRE RUGOSITE METROLOGIE PHYSIQUE THEORIQUE
Keyword (en)
ISING MODEL RANDOM FIELD MEASUREMENT SCIENCE THEORETICAL PHYSICS
Keyword (es)
METROLOGIA FISICA TEORICA
Classification
Pascal
001 Exact sciences and technology / 001B Physics

Discipline
Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL82X0362348

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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