ELECTRICAL CONDUCTION AT HIGH FIELDS IN SINGLE-INJECTION, SOLID-STATE DIODES WITH TRAPS LYING ABOVE THE FERMI LEVELS
- Author
- SHARMA YK
R.B.S. COLL./AGRA 282003/IND - Source
- J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1982; VOL. 53; NO 2; PP. 1241-1243; BIBL. 6 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- DIODE DISPOSITIF ETAT SOLIDE CARACTERISTIQUE COURANT TENSION PIEGE NIVEAU FERMI CHARGE ESPACE ELECTRONIQUE
- Keyword (en)
- DIODE SOLID STATE DEVICE VOLTAGE CURRENT CURVE TRAP FERMI LEVEL SPACE CHARGE ELECTRONICS
- Keyword (es)
- ELECTRONICA
- Classification
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL82X0373674
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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