ZWEIFLAECHENANALYSE VON SCHLIFFPROBEN IM RASTERELEKTRONENMIKROSKOP
- Other title
- TWO-SURFACE ANALYSIS OF POLISHED SECTIONS IN THE SCANNING ELECTRON MICROSCOPE (en)
- Author
- HILLNHAGEN E; SCHAUF E
KRUPP (FRIEDR.) G.M.B.H. FORSCHUNGSINSTITUT/ESSEN/DEU - Source
- PRAKT. METALLOGR.; DEU; DA. 1980-01; VOL. 17; NO 1; PP. 29-34; BIBL. 5 REF.
- Document type
- Conference Paper
- Language
- German
- Keyword (fr)
- TECHNIQUE METALLOGRAPHIQUE METALLOGRAPHIE QUANTITATIVE CONSTITUANT MICROGRAPHIQUE MICROSTRUCTURE DESCRIPTION CONDITIONS OPERATOIRES METROLOGIE MATERIEL ESSAI MICROSCOPIE ELECTRONIQUE BALAYAGE PRECISION PERLITE(PHASE) STRUCTURE LAMELLAIRE METALLURGIE
- Keyword (en)
- METALLOGRAPHIC METHOD QUANTITATIVE METALLOGRAPHY METALLOGRAPHIC CONSTITUENT MICROSTRUCTURE DESCRIPTION PROCESS CONDITIONS METROLOGY TEST EQUIPMENT SCANNING ELECTRON MICROSCOPY PRECISION PEARLITE LAMELLAR STRUCTURE METALLURGY
- Keyword (es)
- METALURGIA
- Classification
- Discipline
- Metals. Metallurgy
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL8300199302
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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Istex access
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Europe PubMed Central access
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