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THE PROPAGATION OF LIGHT WAVES THROUGH OXYGEN IRRADIATION INDUCED DEPTH PROFILES OF THE COMPLEX REFRACTIVE INDEX IN SILICON

Author
HEIDEMANN KF
DORTMUND UNIV. INST. FUER PHYSIK/DEU
Source
PHYS. STATUS SOLIDI (A), APPL. RES.; DDR; DA. 1981-12; VOL. 68; NO 2; PP. 607-617; BIBL. 21 REF.
Document type
Article
Language
English
Keyword (fr)
PROPRIETE OPTIQUE INDICE REFRACTION IMPLANTATION ION OXYGENE ION ETUDE THEORIQUE OXYGENE!ACT SILICIUM ALLIAGE2 SI:>50 O METALLURGIE
Keyword (en)
OPTICAL PROPERTIES REFRACTIVE INDEX ION IMPLANTATION OXYGEN ION THEORETICAL STUDY OXYGEN!ACT SILICON METALLURGY
Keyword (es)
METALURGIA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D11 Metals. Metallurgy

Discipline
Metals. Metallurgy
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL8300228446

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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