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DETERMINATION OF THE ENERGY SPECTRA OF BORON-ION IMPLANTED MOS STRUCTURES BY THE TSC METHOD

Author
NEDEV NR; KASHIEVA SB
BULGARIAN ACAD. SCI., INST. SOLID STATE PHYS./BGR
Source
BULG. J. PHYS.; ISSN 0323-9217; GBR; DA. 1981; VOL. 8; NO 6; PP. 606-610; ABS. RUS; BIBL. 7 REF.
Document type
Article
Language
English
Keyword (fr)
CONDUCTION THERMOSTIMULEE PIEGEAGE PORTEUR CHARGE NIVEAU DEFAUT CRISTALLIN IRRADIATION ION IMPLANTATION ION SILICIUM OXYDE IMPURETE BORE PHYSIQUE SOLIDE
Keyword (en)
THERMOSTIMULATED CONDUCTION CHARGE CARRIER TRAPPING CRYSTAL DEFECT LEVEL IRRADIATION IONS ION IMPLANTATION SOLID PHYSICS
Keyword (es)
FISICA DEL ESTADO CONDENSADO
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL83X0017176

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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