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MEASUREMENT OF RADIATIVE AND AUGER RECOMBINATION RATES IN P-TYPE INGAASP DIODE LASERS

Author
SU CB; SCHLAFER J; MANNING J; OLSHANSKY R
GTE LABORATORIES INC./WALTHAM MA 02254/USA
Source
ELECTRON. LETT.; ISSN 0013-5194; GBR; DA. 1982; VOL. 18; NO 4; PP. 595-596; BIBL. 6 REF.
Document type
Article
Language
English
Keyword (fr)
LASER SEMICONDUCTEUR MESURE RECOMBINAISON AUGER GALLIUM INDIUM PHOSPHOARSENIURE MIXTE RECOMBINAISON RADIATIVE OPTIQUE
Keyword (en)
SEMICONDUCTOR LASER MEASUREMENT AUGER RECOMBINATION GALLIUM INDIUM ARSENIDES PHOSPHIDES MIXED RADIATIVE RECOMBINATION OPTICS
Keyword (es)
OPTICA
Classification
Pascal
001 Exact sciences and technology / 001B Physics

Discipline
Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL83X0114599

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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