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CONTACTLESS MEASUREMENT OF SCHOTTKY BARRIER HEIGHTS USING SECONDARY ELECTRONS

Author
HUANG HCW; HO PS
IBM T.J. WATSON RES. CENT./YORKTOWN HEIGHTS NY 10598/USA
Source
APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1982; VOL. 41; NO 5; PP. 482-484; BIBL. 10 REF.
Document type
Article
Language
English
Keyword (fr)
CONTACT ELECTRIQUE BARRIERE SCHOTTKY DIODE BARRIERE SCHOTTKY HAUTEUR BARRIERE MESURE SANS CONTACT EMISSION ELECTRONIQUE SECONDAIRE ELECTRONIQUE
Keyword (en)
ELECTRIC CONTACT SCHOTTKY BARRIER SCHOTTKY BARRIER DIODE BARRIER HEIGHT NON CONTACT MEASUREMENT SECONDARY ELECTRON EMISSION DIODE ELECTRONICS
Keyword (es)
ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL83X0114632

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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