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ELECTRICAL AND STRUCTURAL PROPERTIES OF P-N JUNCTIONS IN CW LASER ANNEALED SILICON

Author
MAIER M; BIMBERG D; FERNHOLZ G; BAUMGART H; PHILLIPP F
INST. HALBLEITERTECH./AACHEN 5100/DEU
Source
J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1982; VOL. 53; NO 8; PP. 5904-5907; BIBL. 9 REF.
Document type
Article
Language
English
Keyword (fr)
NON METAL JONCTION P N RECUIT FAISCEAU LASER LASER CONTINU BOUCLE DISLOCATION SOUS STRUCTURE MICROSCOPIE ELECTRONIQUE TRANSMISSION MICROSCOPIE OPTIQUE SPECTROMETRIE SIMS POTENTIEL SURFACE CARACTERISTIQUE COURANT TENSION IMPLANTATION ION SILICIUM ETUDE EXPERIMENTALE ARSENIC ION ATOMIQUE CRISTALLOGRAPHIE ELECTRONIQUE
Keyword (en)
NON METAL P N JUNCTION ANNEALING LASER BEAM CW LASER DISLOCATION LOOP SUBSTRUCTURE TRANSMISSION ELECTRON MICROSCOPY OPTICAL MICROSCOPY SECONDARY ION MASS SPECTROMETRY SURFACE POTENTIAL JUNCTION VOLTAGE CURRENT CURVE ION IMPLANTATION SILICON CRISTALLOGRAPHY ELECTRONICS
Keyword (es)
CRISTALOGRAFIA ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL83X0127377

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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