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DETERMINING TUNABLE DIODE LASER SPECTROMETER PERFORMANCE THROUGH MEASUREMENT OF N2O LINE INTENSITIES AND WIDTHS AT 7.8 MU M

Author
DA WUN CHEN; NIPLE ER; POULTNEY SK
PERKIN-ELMER CORP./DANBURY CT 06810/USA
Source
APPL. OPT.; ISSN 0003-6935; USA; DA. 1982; VOL. 21; NO 16; PP. 2906-2911; BIBL. 10 REF.
Document type
Article
Language
English
Keyword (fr)
SPECTROMETRIE OPTIQUE SPECTROMETRE LASER ACCORDABLE LASER IR SPECTROMETRIE IR DIODE HAUTE RESOLUTION AZOTE OXYDE ETAT GAZEUX ETUDE EXPERIMENTALE INTENSITE LARGEUR RAIE SPECTRALE COMPOSE MINERAL MOLECULE TRIATOMIQUE SPECTRE IR PROFIL RAIE SPECTRALE AZOTE DIOXYDE PHYSIQUE MOLECULAIRE PHYSIQUE ATOMIQUE
Keyword (en)
OPTICAL SPECTROMETRY SPECTROMETER TUNABLE LASER INFRARED LASER INFRARED SPECTROMETRY DIODE HIGH RESOLUTION NITROGEN OXIDES GASEOUS STATE EXPERIMENTAL STUDY INTENSITY SPECTRAL LINE WIDTH INORGANIC COMPOUND TRIATOMIC MOLECULE INFRARED SPECTRUM SPECTRAL LINE PROFILE NITROGEN DIOXIDE MOLECULAR PHYSICS ATOMIC PHYSICS
Keyword (es)
FISICA MOLECULAR FISICA ATOMICA
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B30 Atomic and molecular physics

Discipline
Atomic and molecular physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL83X0134412

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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