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A TEST FOR ELECTRON LOCALIZATION IN INTRINSIC SEMICONDUCTORS

Author
PAI M; HONIG JM
PURDUE UNIV., DEP. CHEM./WEST LAFAYETTE IN 47907/USA
Source
PHYS. STATUS SOLIDI (B), BASIC RES.; ISSN 0370-1972; DDR; DA. 1981; VOL. 108; NO 2; PP. K79-K83; BIBL. 5 REF.
Document type
Article
Language
English
Keyword (fr)
LOCALISATION ELECTRONIQUE METHODE CALCUL STRUCTURE ELECTRONIQUE ETAT LOCALISE SEMICONDUCTEUR INTRINSEQUE PHYSIQUE SOLIDE
Keyword (en)
ELECTRON LOCALIZATION CALCULATING METHOD ELECTRONIC STRUCTURE LOCALIZED STATE INTRINSIC SEMICONDUCTOR SOLID PHYSICS
Keyword (es)
FISICA DEL ESTADO CONDENSADO
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL83X0160350

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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