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EVALUATION OF ALUMINIUM GAAS SCHOTTKY BARRIERS USING NORDE'S MODIFIED CURRENT-VOLTAGE ANALYSTS

Author
SCHWARTZ GP; GUALTIERI GJ
BELL LABORATORIES/MURRAY HILL NJ 07974/USA
Source
APPLIED PHYSICS LETTERS; ISSN 0003-6951; USA; DA. 1983; VOL. 42; NO 3; PP. 265-267; BIBL. 10 REF.
Document type
Article
Language
English
Keyword (fr)
CONTACT ELECTRIQUE CONTACT METAL SEMICONDUCTEUR ALUMINIUM GALLIUM ARSENIURE CARACTERISTIQUE COURANT TENSION BARRIERE SCHOTTKY HAUTEUR BARRIERE COUCHE INTERFACIALE MESURE DIODE BARRIERE SCHOTTKY METHODE NORDE ELECTRONIQUE
Keyword (en)
ELECTRIC CONTACT SEMICONDUCTOR METAL CONTACT ALUMINIUM GALLIUM ARSENIDES VOLTAGE CURRENT CURVE SCHOTTKY BARRIER BARRIER HEIGHT INTERFACIAL LAYER MEASUREMENT SCHOTTKY BARRIER DIODE ELECTRONICS
Keyword (es)
ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL83X0213178

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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