A NEW CHARGE-CORRECTION METHOD IN X-RAY PHOTOELECTRON SPECTROSCOPY
- Author
- KOHIKI S; OHMURA T; KUSAO K
MATSUSHITA ELECTRIC INDUSTRIAL CO. LTD./OSAKA 570/JPN - Source
- JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA; ISSN 0368-2048; NLD; DA. 1983; VOL. 28; NO 4; PP. 229-237; BIBL. 24 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- EMISSION PHOTOELECTRONIQUE RAYON X IMPLANTATION ION ARGON ION ENERGIE LIAISON ETAT AMORPHE CRISTAL NIVEAU COEUR METAL TRANSITION SILICIUM SILICIUM OXYDE PALLADIUM ARGENT SYSTEME BARYUM CALCIUM OXYGENE SILICIUM SODIUM OR IMPURETE ARGON PHYSIQUE SOLIDE
- Keyword (en)
- PHOTOELECTRON EMISSION X RAY ION IMPLANTATION ARGON IONS BINDING ENERGY AMORPHOUS STATE CRYSTALS CORE LEVEL TRANSITION METAL SOLID PHYSICS
- Keyword (es)
- FISICA DEL ESTADO CONDENSADO
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL83X0237267
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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