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DETERMINATION OF THREE PARAMETERS OF A DEPTH PROFILE OF FOREIGN ATOMS IN BULK MATERIAL USING PIXE ANALYSIS. II: INFLUENCE OF THE ERRORS OF THEORETICAL QUANTITIES WHICH ARE USED IN THE EVALUATION PROCEDURE

Author
GERETSCHLAGER M
JOHANNES-KEPLER-UNIV. LINZ, INST. EXPERIMENTAL PHYSIK/LINZ 4040/AUT
Source
NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH; ISSN 0167-5087; NLD; DA. 1982; VOL. 203; NO 1-3; PP. 503-508; BIBL. 28 REF.
Document type
Article
Language
English
Keyword (fr)
CONCENTRATION IMPURETE DISTRIBUTION IMPURETE METHODE ETUDE EMISSION RX IMPURETE CRISTALLOGRAPHIE
Keyword (en)
IMPURITY DENSITY IMPURITY DISTRIBUTION INVESTIGATION METHOD X RAY EMISSION IMPURITY CRISTALLOGRAPHY
Keyword (es)
CRISTALOGRAFIA
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL83X0241281

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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