DETERMINATION OF THREE PARAMETERS OF A DEPTH PROFILE OF FOREIGN ATOMS IN BULK MATERIAL USING PIXE ANALYSIS. II: INFLUENCE OF THE ERRORS OF THEORETICAL QUANTITIES WHICH ARE USED IN THE EVALUATION PROCEDURE
- Author
- GERETSCHLAGER M
JOHANNES-KEPLER-UNIV. LINZ, INST. EXPERIMENTAL PHYSIK/LINZ 4040/AUT - Source
- NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH; ISSN 0167-5087; NLD; DA. 1982; VOL. 203; NO 1-3; PP. 503-508; BIBL. 28 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- CONCENTRATION IMPURETE DISTRIBUTION IMPURETE METHODE ETUDE EMISSION RX IMPURETE CRISTALLOGRAPHIE
- Keyword (en)
- IMPURITY DENSITY IMPURITY DISTRIBUTION INVESTIGATION METHOD X RAY EMISSION IMPURITY CRISTALLOGRAPHY
- Keyword (es)
- CRISTALOGRAFIA
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL83X0241281
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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