ANALYSE VON CHEMISCH BEHANDELTEN METALLOBERFLAECHEN DURCH ISS/SIMS
- Other title
- ANALYSE DE SURFACES METALLIQUES TRAITEES CHIMIQUEMENT PAR SPECTROMETRIE DE DIFFUSION IONIQUE/SPECTROMETRIE DE MASSE A IONS SECONDAIRES (fr)
- Author
- PUDERBACH H
HENKEL KGAA/DUESSELDORF 4000/DEU - Source
- FRESENIUS ZEITSCHRIFT FUER ANALYTISCHE CHEMIE; ISSN 0016-1152; DEU; DA. 1983; VOL. 314; NO 3; PP. 260-264; ABS. ENG; BIBL. 16 REF.
- Document type
- Conference Paper
- Language
- German
- Keyword (fr)
- DIFFUSION ION SPECTROMETRIE MASSE SPECTROMETRIE SIMS ANALYSE CHIMIQUE ANALYSE SURFACE TRAITEMENT SURFACE ETAT ADSORBE TRAITEMENT CHIMIQUE DISTRIBUTION CONCENTRATION ALLIAGE SILICATE METAL CHIMIE ANALYTIQUE
- Keyword (en)
- ION SCATTERING MASS SPECTROMETRY SECONDARY ION MASS SPECTROMETRY CHEMICAL ANALYSIS SURFACE ANALYSIS SURFACE TREATMENT ADSORBED STATE CHEMICAL TREATMENT CONCENTRATION DISTRIBUTION ALLOYS SILICATES METAL ANALYTICAL CHEMISTRY
- Keyword (es)
- QUIMICA ANALYTICA
- Classification
- Discipline
- Analytical chemistry
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL83X0251600
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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Istex access
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Europe PubMed Central access
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