MEASUREMENT AND ANALYSIS OF PERIODIC COUPLING IN SILICON-CLAD PLANAR WAVEGUIDES
- Author
- WRIGHT GMC; BATCHMAN TE; STANZIANO MS
UNIV. VIRGINIA, DEP. ELECTRICAL ENG./CHARLOTTESVILLE VA 22901/USA - Source
- IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES; ISSN 0018-9480; USA; DA. 1982; VOL. 30; NO 10; PP. 1753-1759; BIBL. 28 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- OPTIQUE INTEGREE GUIDE ONDE PLAN REVETEMENT SEMICONDUCTEUR SILICIUM DIELECTRIQUE PROPAGATION ONDE ATTENUATION OPTIQUE COUPLAGE OPTIQUE COUPLAGE MODE ELECTRONIQUE OPTIQUE
- Keyword (en)
- INTEGRATED OPTICS PLANAR WAVEGUIDE SEMICONDUCTOR COATING SILICON DIELECTRIC MATERIALS WAVE PROPAGATION OPTICAL ATTENUATION OPTICAL COUPLING MODE COUPLING ELECTRONICS OPTICS
- Keyword (es)
- ELECTRONICA OPTICA
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics
- Discipline
- Electronics Theoretical physics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL83X0261426
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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