POWER MOSFET TEMPERATURE MEASUREMENTS
- Author
- BLACKBURN DL; BERNING DW
NATIONAL BUREAU STANDARDS/WASHINGTON DC 20234/USA - Source
- PESC '82 RECORD. ANNUAL POWER ELECTRONICS SPECIALISTS CONFERENCE. 13/1982-06-14/CAMBRIDGE MA; USA; NEW YORK: IEEE; DA. 1982; PP. 400-407; BIBL. 8 REF.
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- COMPOSANT TRANSISTOR MOS TRANSISTOR EFFET CHAMP DISPOSITIF PUISSANCE ECHAUFFEMENT ESSAI THERMIQUE THERMOCINETIQUE MESURE ELECTROMAGNETISME ELECTROTECHNIQUE
- Keyword (en)
- COMPONENT MOS TRANSISTOR FIELD EFFECT TRANSISTOR POWER DEVICE HEATING UP THERMAL TEST THERMOKINETICS TEST MEASUREMENT ELECTROMAGNETISM ELECTRICAL ENGINEERING
- Keyword (es)
- ELECTROMAGNETISMO ELECTROTECNICA
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D05 Electrical engineering. Electrical power engineering
- Discipline
- Electrical engineering. Electroenergetics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL83X0268346
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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