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POWER MOSFET TEMPERATURE MEASUREMENTS

Author
BLACKBURN DL; BERNING DW
NATIONAL BUREAU STANDARDS/WASHINGTON DC 20234/USA
Source
PESC '82 RECORD. ANNUAL POWER ELECTRONICS SPECIALISTS CONFERENCE. 13/1982-06-14/CAMBRIDGE MA; USA; NEW YORK: IEEE; DA. 1982; PP. 400-407; BIBL. 8 REF.
Document type
Conference Paper
Language
English
Keyword (fr)
COMPOSANT TRANSISTOR MOS TRANSISTOR EFFET CHAMP DISPOSITIF PUISSANCE ECHAUFFEMENT ESSAI THERMIQUE THERMOCINETIQUE MESURE ELECTROMAGNETISME ELECTROTECHNIQUE
Keyword (en)
COMPONENT MOS TRANSISTOR FIELD EFFECT TRANSISTOR POWER DEVICE HEATING UP THERMAL TEST THERMOKINETICS TEST MEASUREMENT ELECTROMAGNETISM ELECTRICAL ENGINEERING
Keyword (es)
ELECTROMAGNETISMO ELECTROTECNICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D05 Electrical engineering. Electrical power engineering

Discipline
Electrical engineering. Electroenergetics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL83X0268346

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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