ELECTRICAL PROPERTIES OF ELECTRON-BEAM-EVAPORATED INDIUM OXIDE THIN FILMS
- Author
- BALASUBRAMANIAN A; RADHAKRISHNAN M; BALASUBRAMANIAN C
MADRAS UNIV. AUTONOMOUS POSTGRADUATE CENT., DEP. PHYS./COIMBATORE 641041/IND - Source
- THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1982; VOL. 91; NO 1; PP. 71-79; BIBL. 38 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- ETAT AMORPHE DIFFRACTION RX CARACTERISTIQUE COURANT TENSION CONDUCTIVITE ELECTRIQUE FREQUENCE EPAISSEUR FREQUENCE AUDIBLE ENERGIE ACTIVATION PERTE DIELECTRIQUE HAUTE TEMPERATURE TEMPERATURE MICROSCOPIE OPTIQUE INDIUM OXYDE DISRUPTION DIELECTRIQUE PHYSIQUE SOLIDE
- Keyword (en)
- AMORPHOUS STATE X RAY DIFFRACTION VOLTAGE CURRENT CURVE ELECTRICAL CONDUCTIVITY FREQUENCY THICKNESS AUDIOFREQUENCY ACTIVATION ENERGY DIELECTRIC LOSS HIGH TEMPERATURE TEMPERATURE OPTICAL MICROSCOPY SOLID PHYSICS
- Keyword (es)
- FISICA DEL ESTADO CONDENSADO
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL83X0269915
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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