INTERMITTENT FAULT COVERAGE DURING TEST OF ELECTRONIC COMPONENTS AND SYSTEMS
- Author
- BICKNELL J
ERA TECHNOLOGY LTD./LEATHERHEAD SURREY KT22 7SA/GBR - Source
- ELECTRONICS LETTERS; ISSN 0013-5194; GBR; DA. 1982; VOL. 18; NO 12; PP. 522-523; BIBL. 4 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- ESSAI DETECTION DEFAUT MODELE ELECTRONIQUE
- Keyword (en)
- TEST DEFECT DETECTION MODELS ELECTRONICS
- Keyword (es)
- ELECTRONICA
- Classification
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL83X0288946
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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