DETERMINATION OF THE STRAIN CONCENTRATION FACTORS AROUND HOLES AND INCLUSIONS IN CRYSTALS BY X-RAY TOPOGRAPHY
- Author
- CHAUDHURI J; KALMAN ZH; WENG GJ; WEISSMANN S
COLL. ENG./PISCATAWAY NJ 08854/USA - Source
- JOURNAL OF APPLIED CRYSTALLOGRAPHY; ISSN 0021-8898; DNK; DA. 1982; VOL. 15; NO 4; PP. 423-429; BIBL. 19 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- PROPRIETE ELASTIQUE TROU INCLUSION TOPOGRAPHIE RX MONOCRISTAL SILICIUM PHYSIQUE SOLIDE
- Keyword (en)
- ELASTIC PROPERTIES HOLE INCLUSION X RAY TOPOGRAPHY SINGLE CRYSTAL SOLID PHYSICS
- Keyword (es)
- FISICA DEL ESTADO CONDENSADO
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL83X0319572
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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