DETERMINATION OF THE CARRIER LIFETIME FROM THE OPEN-CIRCUIT VOLTAGE DECAY OF P-I-N RECTIFIERS AT HIGH-INJECTION LEVELS
- Author
- MOHAMED JAMELEDDINE BEN HAMOUDA; GERLACH W
TECH. UNIV. BERLIN, INST. WERKSTOFFE ELEKTROTECH./BERLIN 1000/DEU - Source
- IEEE TRANSACTIONS ON ELECTRON DEVICES; ISSN 0018-9383; USA; DA. 1982; VOL. 29; NO 6; PP. 953-955; BIBL. 6 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- DIODE DIODE COUCHE INTRINSEQUE DUREE VIE PORTEUR CHARGE METHODE ELEMENT FINI REDRESSEUR ELECTRONIQUE
- Keyword (en)
- DIODE P I N DIODE LIFETIME CHARGE CARRIER FINITE ELEMENT METHOD RECTIFIER ELECTRONICS
- Keyword (es)
- ELECTRONICA
- Classification
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL83X0345373
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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