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DETERMINATION OF THE CARRIER LIFETIME FROM THE OPEN-CIRCUIT VOLTAGE DECAY OF P-I-N RECTIFIERS AT HIGH-INJECTION LEVELS

Author
MOHAMED JAMELEDDINE BEN HAMOUDA; GERLACH W
TECH. UNIV. BERLIN, INST. WERKSTOFFE ELEKTROTECH./BERLIN 1000/DEU
Source
IEEE TRANSACTIONS ON ELECTRON DEVICES; ISSN 0018-9383; USA; DA. 1982; VOL. 29; NO 6; PP. 953-955; BIBL. 6 REF.
Document type
Article
Language
English
Keyword (fr)
DIODE DIODE COUCHE INTRINSEQUE DUREE VIE PORTEUR CHARGE METHODE ELEMENT FINI REDRESSEUR ELECTRONIQUE
Keyword (en)
DIODE P I N DIODE LIFETIME CHARGE CARRIER FINITE ELEMENT METHOD RECTIFIER ELECTRONICS
Keyword (es)
ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL83X0345373

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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