ELECTRICAL CONDUCTIVITY AND HIGH RESOLUTION ELECTRON MICROSCOPY STUDIES OF WO_3-X CRYSTALS WITH 0 <OU= X <OU= 0.28

Author

SAHLE W; NYGREN M
UNIV. STOCKHOLM, DEP. INORGANIC CHEMISTRY/STOCKHOLM 10691/SWE

Source

JOURNAL OF SOLID STATE CHEMISTRY; ISSN 0022-4596; GBR; DA. 1983; VOL. 48; NO 2; PP. 154-160; BIBL. 26 REF.

Document type

Article

Language

English

Keyword (fr)

COMPOSE MINERAL METAL TRANSITION COMPOSE STOECHIOMETRIE CISAILLEMENT CRISTALLOGRAPHIQUE CONDUCTIVITE ELECTRIQUE MICROSCOPIE ELECTRONIQUE TRANSMISSION HAUTE RESOLUTION ETUDE EXPERIMENTALE RELATION STRUCTURE PROPRIETE MICROSTRUCTURE TUNGSTENE VI OXYDE CRISTALLOGRAPHIE

Keyword (en)

INORGANIC COMPOUND TRANSITION METAL COMPOUNDS STOICHIOMETRY CRYSTALLOGRAPHIC SHEAR ELECTRICAL CONDUCTIVITY TRANSMISSION ELECTRON MICROSCOPY HIGH RESOLUTION EXPERIMENTAL STUDY STRUCTURE PROPERTY RELATION MICROSTRUCTURE TUNGSTEN VI OXIDES CRISTALLOGRAPHY

Keyword (es)

CRISTALOGRAFIA

Classification

Pascal

001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography

Discipline

Physics of condensed state : structure, mechanical and thermal properties

Origin

Inist-CNRS

Database

PASCAL

INIST identifier

PASCAL83X0428630

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